The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2011
Filed:
Nov. 27, 2007
Wolfgang Härer, Erlangen, DE;
Marcus Pfister, Bubenreuth, DE;
Wolfgang Härer, Erlangen, DE;
Marcus Pfister, Bubenreuth, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A number of two-dimensional projection images of a three-dimensional examination object are assigned image times and imaging parameters. The projection images are combined into reconstruction groups including projection images with image times specifically assigned or within a time interval specific to the reconstruction groups. The reconstruction groups are determined in such a way that three-dimensional reconstructions of the examination object with direction-dependent local resolution can be determined based on the projection images of the reconstruction groups; it is not possible to determine three-dimensional reconstructions of the examination object with direction-independent local resolution. Three-dimensional reconstructions of the examination are determined based on the projection images of the reconstruction groups. Reconstruction times are determined based on the image times assigned to the projection images of the reconstruction groups and assigned to the three-dimensional reconstructions. Further analyses are performed as a function of the temporal sequence of the three-dimensional reconstructions.