The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2011
Filed:
Oct. 05, 2010
Huaiyu (Hanks) Zeng, Red Bank, NJ (US);
Jie Lai, Belle Mead, NJ (US);
Yueheng Sun, Manalapan, NJ (US);
Nelson Sollenberger, Farmingdale, NJ (US);
Arie Heiman, Rannana, IL (US);
Yossy Pruzanski, Ramat Gan, IL (US);
Huaiyu (Hanks) Zeng, Red Bank, NJ (US);
Jie Lai, Belle Mead, NJ (US);
Yueheng Sun, Manalapan, NJ (US);
Nelson Sollenberger, Farmingdale, NJ (US);
Arie Heiman, Rannana, IL (US);
Yossy Pruzanski, Ramat Gan, IL (US);
Broadcom Corporation, Irvine, CA (US);
Abstract
Aspects of a method and system for decoding single antenna interference cancellation (SAIC) and redundancy processing adaptation using frame process are provided. A receiver may decode video, voice, and/or speech bit sequences based on a first decoding algorithm that may utilize data redundancy and that may impose physical constraints. The receiver may also decode a bit sequence based on a second decoding algorithm that utilizes SAIC. The first and second decoding algorithms may be adapted to perform in parallel and a decoded received bit sequence may be selected based on a redundancy verification parameter. The first and second decoding algorithms may also be adapted to be performed sequentially where the subsequent decoding operation may be conditioned to the initial decoding operation. Moreover, either the first or the second decoding algorithm may be selected for decoding the received bit sequence. The selection may be based on noise and/or interference measurements.