The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2011
Filed:
Jan. 08, 2008
Pansop Kim, Torrance, CA (US);
Jeng-hong Chen, Temple City, CA (US);
Pansop Kim, Torrance, CA (US);
Jeng-Hong Chen, Temple City, CA (US);
Integrated System Solution Corp., Hsinchu, TW;
Abstract
The present invention discloses an effective apparatus and method to measure the received signal quality for digital communication systems by measuring error vector measurement (EVM) with embedded EVM measurement block in receivers. The distinction of the present invention is that the EVMand the EVMare measured in the receiver for the SIGNAL fields and DATA fields, respectively. EVMis a good indicator for one spatial stream and EVMis a good indicator for current multiple streams. The receiver determines the optimum number of spatial data streams for feedback to the transmitter based on the combinations of EVMand EVMwith or without other algorithms such as analysis on periodically requested sounding packet. The receiver also determines the optimum modulation and coding schemes for feedback based on the EVM measurements.