The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2011
Filed:
Jul. 18, 2005
Jochen Strähle, Weissach, DE;
Ulrich Kallmann, Tuebingen, DE;
Rahmi Gencoglu, Nilüfer/Bursa, TR;
Uwe Kasten, Moeglingen, DE;
Jochen Strähle, Weissach, DE;
Ulrich Kallmann, Tuebingen, DE;
Rahmi Gencoglu, Nilüfer/Bursa, TR;
Uwe Kasten, Moeglingen, DE;
Robert Bosch GmbH, Stuttgart, DE;
Abstract
An interferometric system having an illumination arm, including a light source and an illuminating optical system, for forming an illuminating beam; an object arm, including a reference element for measuring an object having an object surface to be measured, for forming an image-rays path, the object to be measured having an object surface inaccessible to direct illumination; a reference arm including a reference element; a detector arm including a detector; and a beam splitter, the reference element having one or more mirrored zones. Consequently, component parts which have undercut surfaces in the illumination direction can be measured in a single measuring operation.