The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8035751 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 11, 2011

Filed:

Sep. 25, 2009
Applicants:

Darren Neuman, Palo Alto, CA (US);

Joseph Del Rio, San Jose, CA (US);

Vadim Kochubievski, Ontario, CA;

Craig Zinkievich, Boulder Creek, CA (US);

Shannon Posniewski, San Jose, CA (US);

Alexander G. Macinnis, Los Altos, CA (US);

Inventors:

Darren Neuman, Palo Alto, CA (US);

Joseph Del Rio, San Jose, CA (US);

Vadim Kochubievski, Ontario, CA;

Craig Zinkievich, Boulder Creek, CA (US);

Shannon Posniewski, San Jose, CA (US);

Alexander G. MacInnis, Los Altos, CA (US);

Assignee:

Broadcom Corporation, Irvine, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 9/64 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for detecting the presence and location of pull-down fields in a video field stream. Various aspects of the present invention may comprise method steps and circuit structure for generating an array of variance indications, each of which represents a degree of variance between two video fields in the video field stream. Various aspects may comprise comparing the array of variance indications to a pattern to detect a pull-down field in the video field stream. Various aspects may comprise comparing corresponding portions of video fields and generating a histogram of differences between the corresponding portions. Various aspects may comprise generating an indication of variance of the histogram and analyzing the indication of variance. Various aspects may comprise analyzing an array of such indications of variance and may comprise comparing the array of such indications to a pattern or plurality of patterns.


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