The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2011
Filed:
Feb. 20, 2008
Applicant:
Yuji Watarai, Kasugai, JP;
Inventor:
Yuji Watarai, Kasugai, JP;
Assignee:
Fujitsu Semiconductor Limited, Yokohama, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/217 (2006.01); H04N 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A noise characteristics measurement device that facilitates the measurement of noise characteristics in an imaging sensor. The noise characteristics measurement device has a classification circuit including a plurality of pixel value regions obtained by dividing a numerical range that can be taken by pixel values of the imaging sensor in accordance with the level of a pixel value. The classification circuit classifies pixel values of the imaging sensor into the plurality of pixel value regions. A calculation circuit calculates a value representing a dispersion degree of the pixel values classified into each pixel value region.