The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2011

Filed:

Nov. 13, 2007
Applicants:

Yasuhiro Tajima, Toyota, JP;

Naoto Hasegawa, Toyota, JP;

Akihiro Ueda, Toyota, JP;

Kiyomi Nagamiya, Nissin, JP;

Mitsuru Nakamura, Kasugai, JP;

Naoto Shibata, Aichi-gun, JP;

Inventors:

Yasuhiro Tajima, Toyota, JP;

Naoto Hasegawa, Toyota, JP;

Akihiro Ueda, Toyota, JP;

Kiyomi Nagamiya, Nissin, JP;

Mitsuru Nakamura, Kasugai, JP;

Naoto Shibata, Aichi-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 19/48 (2010.01); H04B 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A device for measuring a position of a mobile station according to the present invention comprises: first measuring means for measuring the position of the mobile station based on observed data of signals from satellites using a one-epoch measuring method; second measuring means for measuring the position of the mobile station using previous determination result of the position of the mobile station and speed information representative of a speed of the mobile station; third measuring means for measuring the position of the mobile station using solutions of variables derived from previous determination results of the first or second measuring means; and controlling meansfor selecting one of the respective measuring means which is to execute its measuring process; wherein if reliability of the determination result of the selected measuring means is lower than a predetermined reference value, the controlling means selects another measuring means to make it execute its measuring process.


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