The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2011
Filed:
Mar. 16, 2006
Masaru Shinkai, Yokohama, JP;
Michiaki Shinotsuka, Hiratsuka, JP;
Hiroyoshi Sekiguchi, Yokohama, JP;
Masaki Kato, Sagamihara, JP;
Masaru Shinkai, Yokohama, JP;
Michiaki Shinotsuka, Hiratsuka, JP;
Hiroyoshi Sekiguchi, Yokohama, JP;
Masaki Kato, Sagamihara, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
A two-layered optical recording medium which includes a first substrate, a first information layer, a second information layer, and a second substrate formed in this order as viewed from the light beam irradiation side, the first information layer includes a first lower dielectric layer, a first recording layer, a first upper dielectric layer, a first reflective layer, and an inorganic dielectric layer formed in this order as viewed from the light beam irradiation side; the second information layer includes a second lower dielectric layer, a second recording layer, a second upper dielectric layer, and a second reflective layer formed in this order as viewed from the light beam irradiation side; and the first reflective layer is made of Cu with a content of 99.8% by mass to 95.0% by mass and one or more metals selected from Ta, Nb, Zr, Ni, Cr, Ge, Au, and Mo.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile