The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2011
Filed:
Sep. 27, 2010
Applicant:
Shui T. Lai, Encinitas, CA (US);
Inventor:
Shui T. Lai, Encinitas, CA (US);
Assignee:
Ophthonix, Inc., Vista, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/14 (2006.01);
U.S. Cl.
CPC ...
Abstract
An apparatus for determining spherical and cylinder components of subjective refraction of a patient's vision includes a wavefront measurement device that can produce a measure of quality of vision in a return beam from the patient's eye viewing a target through a corrective test lens in the apparatus. The corrective lenses may be varied and a plurality of measurements of quality of vision may be obtained and analyzed to determine the spherical and cylinder components. Accordingly, the eye examiner may conduct a refraction examination without a subjective response from the patient.