The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2011
Filed:
Nov. 28, 2006
Nicolai Kosche, San Francisco, CA (US);
Kenneth Tracton, Palo Alto, CA (US);
Nicolai Kosche, San Francisco, CA (US);
Kenneth Tracton, Palo Alto, CA (US);
Oracle America, Inc., Redwood City, CA (US);
Abstract
A system and method for profiling a software application may include means for defining a custom cost metric that includes a cost metric identifier and a cost function. The cost function may apply a mathematical formula to data extracted from an event set to calculate a respective cost metric value for each of one or more events in the event set. The data extracted from the event set may include one or more respective profiling object identifiers and one or more other respective costs associated with each of the one or more events. A cost associated with an event in the event space may be associated with a function or basic block of instructions. The cost function may include a distribution formula for attributing at least a portion of the cost associated with a function or basic block to each of the instructions comprising the function or basic block.