The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8032807 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 04, 2011

Filed:

Mar. 03, 2009
Applicants:

Yoshikazu Iwami, Kawasaki, JP;

Takayuki Kinoshita, Kawasaki, JP;

Hidekazu Osano, Kawasaki, JP;

Inventors:

Yoshikazu Iwami, Kawasaki, JP;

Takayuki Kinoshita, Kawasaki, JP;

Hidekazu Osano, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A scan control method for a circuit device connected with a first bus and having a test access port controller, including setting information indicating a register to be scanned in the circuit device, a number of scan shifts and a scan start via a second bus different from the first bus, and generating based on the information set, by using a sequencer, a signal replacing a test mode signal and a test reset signal transferred via the first bus during testing of the circuit device, and supplying the signal to the test access port controller.


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