The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2011

Filed:

Aug. 19, 2009
Applicants:

Tatsuo Kumano, Kawasaki, JP;

Kazutaka Ogihara, Kawasaki, JP;

Masahisa Tamura, Kawasaki, JP;

Yoshihiro Tsuchiya, Kawasaki, JP;

Tetsutaro Maruyama, Kawasaki, JP;

Takashi Watanabe, Kawasaki, JP;

Yasuo Noguchi, Kawasaki, JP;

Riichiro Take, Kawasaki, JP;

Inventors:

Tatsuo Kumano, Kawasaki, JP;

Kazutaka Ogihara, Kawasaki, JP;

Masahisa Tamura, Kawasaki, JP;

Yoshihiro Tsuchiya, Kawasaki, JP;

Tetsutaro Maruyama, Kawasaki, JP;

Takashi Watanabe, Kawasaki, JP;

Yasuo Noguchi, Kawasaki, JP;

Riichiro Take, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A simultaneous failure occurrence degree calculation section calculates a simultaneous failure occurrence degree a value of which becomes smaller with an increase in a difference between numeric values indicative of manufacture date information on a computer which performs a process on the basis of a duplication combination management program. A combination pattern generation section then combines two of a plurality of storage apparatus and generates a plurality of combination patterns. A simultaneous failure occurrence degree adding section then calculates a total of simultaneous failure occurrence degrees corresponding to combinations of storage apparatus for each of the plurality of combination patterns. A duplication combination pattern determination section then determines that a combination pattern for which the total of simultaneous failure occurrence degrees is the smallest is a duplication combination pattern.


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