The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2011

Filed:

May. 23, 2008
Applicants:

Saurabh Bagchi, West Lafayette, IN (US);

Rajarshi Das, New Rochelle, NY (US);

Yixin Diao, White Plains, NY (US);

Marc Adam Kaplan, Katonah, NY (US);

Jeffrey Owen Kephart, Cortlandt Manor, NY (US);

Inventors:

Saurabh Bagchi, West Lafayette, IN (US);

Rajarshi Das, New Rochelle, NY (US);

Yixin Diao, White Plains, NY (US);

Marc Adam Kaplan, Katonah, NY (US);

Jeffrey Owen Kephart, Cortlandt Manor, NY (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/177 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system performs dynamic online multi-parameter optimization for autonomic computing systems. A simplex is maintained. The system's performance is measured for the particular setting of configuration parameters associated with each point in the simplex. A new sample point is determined using the geometric transformations of the simplex. A current best point in the simplex can be resampled to determine if the environment has changed. If a sufficiently different utility value is obtained from a previously sampled utility value for the point in the simplex, the simplex is expanded. If the difference is not sufficient enough, then contraction of the simplex is performed.


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