The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2011
Filed:
Dec. 04, 2006
Scott Shelton, Apex, NC (US);
David Carmer, Cary, NC (US);
Henry Fu, Chapel Hill, NC (US);
Jason Figge, Pittsboro, NC (US);
Leslie Mannion, Wake Forest, NC (US);
Michael Chaves, Cary, NC (US);
Claud Teeter, Fuquay Varina, NC (US);
Robert Baril, Apex, NC (US);
Scott Shelton, Apex, NC (US);
David Carmer, Cary, NC (US);
Henry Fu, Chapel Hill, NC (US);
Jason Figge, Pittsboro, NC (US);
Leslie Mannion, Wake Forest, NC (US);
Michael Chaves, Cary, NC (US);
Claud Teeter, Fuquay Varina, NC (US);
Robert Baril, Apex, NC (US);
Teradata US, Inc., Dayton, OH (US);
Abstract
Tools for defining and using custom analysis modules are presented. A generic graphical user interface (GUI) custom analysis tool is presented to a user. The generic GUI custom analysis tool is adapted to receive selections and inputs from the user that define many-to-many relationships in a data store and that include user-defined measures. The inputs are used to generate an instance of a custom analysis module that is capable of being processed against the data store. The instance of the custom analysis module may be stored, recalled, executed, and/or modified from the generic GUI custom analysis tool.