Method and system to monitor, debug, and analyze performance of an electronic design

Abstract

Various methods and apparatuses are described that provide instrumentation and analysis of an electronic design. A performance monitoring apparatus may be located on an interconnect of a fabricated integrated circuit. An event measurement module (EM) includes an event generator sub-module that generates monitoring events and event measurements associated with transactions between initiator intellectual property (IP) cores and target IP cores over the interconnect. The EM further includes a software visible register block that provides software access for controlling the EM on which one or more transactions to monitor and to configure one or more parameters associated with that transaction to track. The EM further includes a filtering sub-module that selects transactions to be monitored based on information received from the software. The performance counter module aggregates events and event measurements received from the EM into quantities of performance metrics associated with transactions between the IP cores over the interconnect.