The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2011
Filed:
Apr. 09, 2008
Applicant:
Craig Sullender, Austin, TX (US);
Inventor:
Craig Sullender, Austin, TX (US);
Assignee:
Eyep Inc., Austin, TX (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract
Provided is a system and method for processing data and images including, but not limited to separating data into a plurality of data planes; performing noise analysis to determine an average noise amplitude and noise distribution for each data plane via a gradient calculation; applying an edge mask to weaken isolated transients in one or more of the data planes; applying a noise filter using one or more levels of filtering to one or more of the data planes; and performing detail recovery combining a composite data plane and filtered and unfiltered data planes according to the noise analysis.