The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2011
Filed:
Apr. 09, 2007
Rujie Liu, Beijing, CN;
Takayuki Baba, Kawasaki, JP;
Susumu Endo, Kawasaki, JP;
Shuchi Shiitani, Kawasaki, JP;
Yusuke Uehara, Kawasaki, JP;
Daiki Masumoto, Kawasaki, JP;
Rujie Liu, Beijing, CN;
Takayuki Baba, Kawasaki, JP;
Susumu Endo, Kawasaki, JP;
Shuchi Shiitani, Kawasaki, JP;
Yusuke Uehara, Kawasaki, JP;
Daiki Masumoto, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
The present invention discloses a shape comparison apparatus and method based on contour decomposition and correspondence. The apparatus comprises a polygonal approximation unit for approximating an image object contour as a polygon, namely representing the image object contour into an ordered contour primitive sequence; an attribute generation unit for calculating attribute value for contour primitive and contour primitive composition; and a comparison unit for establishing correspondence of polygons and hence calculating similarity between contours. Preferably, the apparatus further comprises an image object contour extraction unit for extracting, in the case the input into the apparatus is an image object rather than an image object contour, an image object contour of an image object inputted into the apparatus.