The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2011
Filed:
Mar. 27, 2008
Applicant:
Ikuo Hayaishi, Matsumoto, JP;
Inventor:
Ikuo Hayaishi, Matsumoto, JP;
Assignee:
Seiko Epson Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An image processing device includes a deformation processing unit that deforms at least a portion of an area on a target image, which is generated by photographing, based on a distance between a photographic device and a subject of the target image. A deformation amount adjustment unit uses a distance parameter that correlates with the distance between the photographic device and the subject of the target image when photographing to thereby adjust a degree of deformation to increase as a distance indicated by the distance parameter becomes shorter.