The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2011
Filed:
Oct. 26, 2007
Zhye Yin, Schenectady, NY (US);
Bruno Kristiaan Bernard Deman, Clifton Park, NY (US);
Jed Douglas Pack, Glenville, NY (US);
Zhye Yin, Schenectady, NY (US);
Bruno Kristiaan Bernard DeMan, Clifton Park, NY (US);
Jed Douglas Pack, Glenville, NY (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A method for analytically reconstructing a multi-axial computed tomography (CT) dataset, acquired using one or more longitudinally-offset x-ray beams emitted from multiple x-ray sources is provided. The method comprises acquiring one or more CT axial projection datasets, wherein the CT axial projection datasets are acquired using less than a full scan of data. The method further comprises reconstructing the CT axial projection datasets to generate a reconstructed image volume. The reconstruction comprises back projecting one or more voxels comprising the multi-axial CT dataset, along one or more projection views, based upon a cone-angle weight determined for the voxels, wherein the cone-angle weight for the voxels is determined along a longitudinal direction.