The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2011

Filed:

Apr. 30, 2010
Applicants:

Bruno Kristiaan Bernard Deman, Clifton Park, NY (US);

Jiang Hsieh, Brookfield, WI (US);

Jed Douglas Pack, Glenville, NY (US);

Kai Zeng, Niskayuna, NY (US);

Inventors:

Bruno Kristiaan Bernard DeMan, Clifton Park, NY (US);

Jiang Hsieh, Brookfield, WI (US);

Jed Douglas Pack, Glenville, NY (US);

Kai Zeng, Niskayuna, NY (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one embodiment, a first set of projection data is acquired using a first portion of a detector and a second set of projection data is acquired using a second portion of the detector. The second set of projection data is supplemented based upon the first set of projection data to generate a supplemented set of projection data. A volumetric image may be generated using the supplemented set of projection data.


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