The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2011
Filed:
Jun. 04, 2009
Applicants:
Yu Gu, Plainsboro, NJ (US);
Geoff Jiang, Princeton, NJ (US);
Vishal Singh, Plainsboro, NJ (US);
Yueping Zhang, Somerset, NJ (US);
Inventors:
Yu Gu, Plainsboro, NJ (US);
Geoff Jiang, Princeton, NJ (US);
Vishal Singh, Plainsboro, NJ (US);
Yueping Zhang, Somerset, NJ (US);
Assignee:
NEC Laboratories America, Inc., Princeton, NJ (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
Abstract
Systems and methods are disclosed to probe a network includes generating a set of probing pairs from a network topology for unicast network delay tomography; probing the network using monitoring hosts in the network; and determining network performance from the probing results.
Gu, Yu. (2011). Optimal probing for unicast network delay tomography (U.S. Patent No. 8031628). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8031628
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile