The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2011
Filed:
Dec. 29, 2009
Nan Sun, Cambridge, MA (US);
Nan Sun, Cambridge, MA (US);
President and Fellows of Harvard College, Cambridge, MA (US);
Abstract
Methods and systems are described relating to dual-mode based digital background calibration of pipelined ADCs, for gain variations and device mismatches. Errors caused by gain insufficiency, nonlinearity, and capacitor mismatches are corrected by operating one ADC in two circuit configurations. These two modes are so arranged that their digital outputs differ in the presence of gain nonlinearity, gain insufficiency, and capacitor mismatches. The output difference is measured by randomly choosing one of the two operation modes at each sampling clock and digitally correlating the resulting digital output sequence. The measured output difference, which represents ADC errors, is used to remove the errors.