The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2011
Filed:
May. 11, 2005
Ward DE Ceuninck, Nerem, BE;
Ward De Ceuninck, Nerem, BE;
IMEC, Leuven, BE;
Universiteit Hasselt, Diepenbeek, BE;
Abstract
The present disclosure is related to a method for determining time to failure characteristics of a microelectronics device. A test structure, being a parallel connection of a plurality of such on-chip interconnects, is provided. Measurements are performed on the test structure under test conditions for current density and temperature. The test structure is arranged such that failure of one of the on-chip interconnects within the parallel connection changes the test conditions for at least one of the other individual on-chip interconnects of the parallel connection. From these measurements, time to failure characteristics are determined, whereby the change in the test conditions is compensated for.