The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2011
Filed:
Nov. 26, 2008
Christopher Warren Brock, Manorville, NY (US);
Jonathan Chin, North Babylon, NY (US);
Christopher Fjellstad, Smithtown, NY (US);
David P. Goren, Smithtown, NY (US);
Patrick Mauro, Lake Grove, NY (US);
David Tsi-shi, Stony Brook, NY (US);
Michael Steele, Wantagh, NY (US);
Christopher Warren Brock, Manorville, NY (US);
Jonathan Chin, North Babylon, NY (US);
Christopher Fjellstad, Smithtown, NY (US);
David P. Goren, Smithtown, NY (US);
Patrick Mauro, Lake Grove, NY (US);
David Tsi-Shi, Stony Brook, NY (US);
Michael Steele, Wantagh, NY (US);
Symbol Technologies, Inc., Holtsville, NY (US);
Abstract
An imaging system with in-field image quality testing and reporting features, includes a housing, and a solid-state imager having an array of image sensors supported by the housing for capturing return light from a target located in a range of working distances from the housing in an image capture mode of operation, and for capturing return light from a test pattern positioned at a predetermined position in the range of working distances in a test mode of operation different from the image capture mode. An electrical signal indicative of the captured return light is generated in each mode. A memory is supported by the housing for storing a test program for testing image quality. A controller is supported by the housing for processing the electrical signal in the image capture mode, and for accessing the memory to enable the controller to execute the test program in the test mode to test the image quality of the test pattern imaged by the imaging system, and for reporting test results of the image quality of the test pattern.