The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2011
Filed:
Oct. 19, 2007
Applicant:
Kiyoaki Takiguchi, Kanagawa, JP;
Inventor:
Kiyoaki Takiguchi, Kanagawa, JP;
Assignee:
Sony Corporation, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01H 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A marker detection apparatus detects a marker attached to a target sample from samples flowing in a sample flow, including: an electric field formation section that forms a quasi-electrostatic field in a path of the sample flow; and a detection section that detects, when the target sample labeled by the marker that is a particle made from a piezoelectric or electrostrictive substance of a unique vibration frequency gets into the quasi-electrostatic field, the vibration of the particle.
Takiguchi, Kiyoaki. (2011). Marker detection apparatus and marker detection method (U.S. Patent No. 8028582). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8028582
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile