The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2011
Filed:
May. 26, 2008
Applicants:
Chih-wei Tang, Penghu County, TW;
Chien-yu Wei, Hsinchu County, TW;
Wei-yi Wei, Nantou County, TW;
Jia-jye Shyu, Hsinchu, TW;
Inventors:
Chih-Wei Tang, Penghu County, TW;
Chien-Yu Wei, Hsinchu County, TW;
Wei-Yi Wei, Nantou County, TW;
Jia-Jye Shyu, Hsinchu, TW;
Assignee:
NOVATEK Microelectronics Corp., Hsinchu Science Park, Hsin-Chu, TW;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
A data transformation method for a testing system includes using a reception end for receiving a test signal comprising a test data and a timing information corresponding to the test data, and using a transformation unit for transforming the test data according to the timing information, so as to generate a test pattern utilized for testing a communication device.