The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2011

Filed:

Jul. 16, 2008
Applicants:

Gerald G. Kiernan, San Jose, CA (US);

Evimaria Terzi, Palo Alto, CA (US);

Inventors:

Gerald G. Kiernan, San Jose, CA (US);

Evimaria Terzi, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06F 11/00 (2006.01); G06N 7/00 (2006.01); G06N 7/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a method and system for constructing one or more a comprehensive summaries of event sequence(s). The present invention approaches the problem of finding the shortest yet most comprehensive summary of an event sequence by transforming this summarization problem into a concrete optimization problem and provides a computer-implementing technique for solving this optimization problem to construct and/or form the basis for constructing the summaries. The summaries describe an entire event sequence while at the same time reveal local associations between events of that sequence. In certain embodiments, the segmentation of the event sequence produced in accordance with the present invention is itself a summary of the event sequence. In other embodiments, the segmentation produced forms a basis for one or more summaries.


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