The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2011
Filed:
Jun. 19, 2008
Patrick Paul Camus, Middleton, WI (US);
Gregory S. Fritz, Verona, WI (US);
Thomas B. Jacobs, Madison, WI (US);
Dean A. Stocker, Fitchburg, WI (US);
Dale Anders Wade, Mount Horeb, WI (US);
Patrick Paul Camus, Middleton, WI (US);
Gregory S. Fritz, Verona, WI (US);
Thomas B. Jacobs, Madison, WI (US);
Dean A. Stocker, Fitchburg, WI (US);
Dale Anders Wade, Mount Horeb, WI (US);
Thermo Electron Scientific Instruments LLC, Madison, WI (US);
Abstract
In an energy dispersive spectrometer wherein event (particle/photon) detection is performed by counting events spaced by greater than a shaping time, events which are spaced by less than the shaping time are also collected and counted. These 'combined events' are treated similarly to 'single events' which are spaced by greater than the shaping time, and can be used to generate combined-event spectra for comparison and/or use with the conventional single-event spectra. The combined-event spectra can be compared to the single-event spectra to provide an indication of data quality; can be subtracted from the single-event spectra to remove artifacts, and/or can be deconvolved into a single-event spectrum to increase the resolution of the single-event spectrum.