The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2011
Filed:
Aug. 30, 2006
Shigeto Nishiuchi, Kanagawa, JP;
Satoshi Takahashi, Kanagawa, JP;
Masashi Tsuyama, Kanagawa, JP;
Takahiro Nakagawa, Kanagawa, JP;
Shigeto Nishiuchi, Kanagawa, JP;
Satoshi Takahashi, Kanagawa, JP;
Masashi Tsuyama, Kanagawa, JP;
Takahiro Nakagawa, Kanagawa, JP;
Abstract
Embodiments of the invention provide a data storage device test method and data storage device manufacture method which allow a tester to perform an operation test of plural data storage devices connected thereto in a shorter period of time. In one embodiment, an operation test of each of plural HDDs-connected to a tester is performed by making plural HDDs-execute commands received from the tester, wherein, during a waiting period when exchange stops between the tester and, for example, HDDof which operation test is being executed, the tester executes the operation test of another HDD. Such a waiting period occurs, for example, before HDDbecomes ready to receive a command, before a data transfer is completed and before HDDbecomes ready to receive the subsequent command. By using this waiting period, the tester issues a command to, for example, HDDif the HDD is ready to receive a command or transfers data to the HDD if data transfer is possible.