The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2011
Filed:
Oct. 27, 2006
Shoji Kinomura, Takarazuka, JP;
Yoshiyuki Nakao, Kobe, JP;
Toshiya Kodai, Amagasaki, JP;
Shugo Nishiyama, Takarazuka, JP;
Shoji Kinomura, Takarazuka, JP;
Yoshiyuki Nakao, Kobe, JP;
Toshiya Kodai, Amagasaki, JP;
Shugo Nishiyama, Takarazuka, JP;
Sumitomo Metal Industries, Ltd., Osaka, JP;
Abstract
A method in accordance with the present invention includes the steps of: separating an eddy current signal into an X-axis component and a Y-axis component to obtain signal waveform data of the respective components; excluding predetermined low-frequency components respectively from the respective signal waveform data thus obtained; calculating a noise voltage value Vdefined by the following Equation (1) based upon voltage values X(i) and Y(i) of the signal waveform data of the X-axis component and the Y-axis component from which the low-frequency components have been excluded; and calculating an S/N ratio by dividing a voltage value D of an eddy current signal corresponding to a predetermined artificial flaw by the noise voltage value V: where n represents the number of samplings of the signal waveform data.