The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2011
Filed:
Sep. 01, 2010
Masafumi Oshiro, Hamamatsu, JP;
Koji Ichie, Hamamatsu, JP;
Masafumi Oshiro, Hamamatsu, JP;
Koji Ichie, Hamamatsu, JP;
Hamamatsu Photonics K.K., Hamamatsu-shi, Shizuoka, JP;
Abstract
A microscope system is constructed by a light guiding optical systemhaving an objective lensand beam splittersandfor splitting an optical image of a sample S, a photodetectorfor acquiring an image of the sample S, and two CCD camerasandfor focus control disposed on optical paths split by the beam splittersand. The camerasandare disposed being inclined with respect to the optical path so that the optical paths thereof in the light guiding optical systemvary along a z-axis direction in opposite directions to each other. Images acquired by these camerasandare analyzed in a focus controller, and the image pickup focal point to the sample S is controlled on the basis of the analysis result, whereby the focus control when an image of the sample is acquired can be suitably performed.