The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8027376 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 27, 2011

Filed:

Feb. 06, 2004
Applicants:

Akira Yamanaka, Union City, CA (US);

Iason Vassiliou, Berkeley, CA (US);

Inventors:

Akira Yamanaka, Union City, CA (US);

Iason Vassiliou, Berkeley, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/38 (2006.01);
U.S. Cl.
CPC ...
Abstract

Aspects for measuring IQ path mismatch in signal modulation are described. The aspects include estimating a transmitter IQ mismatch in a form of gain and phase response for transmitter I and Q paths sharing a receiver path, and estimating a receiver IQ mismatch in a form of gain and phase response for receiver I and Q paths sharing a signal source. Further included is compensating for the difference of the transmitter and receiver I and Q paths using a digital FIR filter. Iterative estimation is utilized for filter tap parameters during the compensating.


Find Patent Forward Citations

Yamanaka, Akira. (2011). Method and system for measuring iq path mismatch (U.S. Patent No. 8027376). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8027376

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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