The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2011

Filed:

Nov. 19, 2008
Applicants:

Daisuke Tanahashi, Hachioji, JP;

Yayoi Eguro, Hachioji, JP;

Inventors:

Daisuke Tanahashi, Hachioji, JP;

Yayoi Eguro, Hachioji, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

An imaging lens good in mass-productivity, compact, low in manufacturing cost, good in aberration performance is provided by effectively correcting aberrations without greatly varying the variation of the thickness of a curing resin. An imaging device having such an imaging lens and a portable terminal are also provided. A third lens (L) has a flat surface on the object side, a convex surface near the optical axis on the image side, and a concave aspheric surface around the peripheral portion within the region where a light beam passes. Therefore, it is possible to reduce the other optical aberrations such as distortion and simultaneously to design the imaging lens so that the astigmatism takes on a maximum value at the outermost portion. Hence, the resolutions at low to middle image heights are high. In addition, such a shape does not cause a large variation of the thickness of the third lens (L) from the region along the axis to the periphery. Therefore, the thickness of the third lens (L) can be small, and the material cost can be reduced.


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