The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2011
Filed:
Aug. 22, 2008
Microscopy imaging system and method employing stimulated raman spectroscopy as a contrast mechanism
Xiaoliang Sunney Xie, Lexington, MA (US);
Christian Freudiger, Boston, MA (US);
Wei Min, Cambridge, MA (US);
Xiaoliang Sunney Xie, Lexington, MA (US);
Christian Freudiger, Boston, MA (US);
Wei Min, Cambridge, MA (US);
President & Fellows of Harvard College, Cambridge, MA (US);
Abstract
A microscopy imaging system includes a first light source for providing a first train of pulses at a first center optical frequency ω, a second light source for providing a second train of pulses at a second center optical frequency ω, a modulator system, an optical detector, and a processor. The modulator system is for modulating a beam property of the second train of pulses at a modulation frequency f of at least 100 kHz. The optical detector is for detecting an integrated intensity of substantially all optical frequency components of the first train of pulses from the common focal volume by blocking the second train of pulses being modulated. The processor is for detecting, a modulation at the modulation frequency f, of the integrated intensity of the optical frequency components of the first train of pulses to provide a pixel of an image for the microscopy imaging system.