The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2011
Filed:
Jun. 08, 2007
David Laur, Seattle, WA (US);
Timothy S. Milliron, Berkeley, CA (US);
Maxwell Planck, San Francisco, CA (US);
David Laur, Seattle, WA (US);
Timothy S. Milliron, Berkeley, CA (US);
Maxwell Planck, San Francisco, CA (US);
Pixar, Emeryville, CA (US);
Abstract
Programmable or user-defined visibility functions can be defined to achieve rendering effects and eliminate rendering errors. A renderer traverses the set of geometry samples potentially visible to an image sample. Rather than accumulate opacity and color in strict depth order, the renderer can invoke visibility functions associated with some or all of the geometry samples. Each geometry sample's visibility function can access attributes of any other geometry sample associated with the image sample. Furthermore, each geometry sample's visibility function can identify the position of its associated geometry sample and any other geometry samples in the depth sequence of geometry samples associated with an image sample. A visibility function can return any arbitrary value based on attributes of its associated geometry sample, attributes of other geometry samples associated with the image sample, and/or the position of geometry samples in the depth sequence associated with the image sample.