The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2011
Filed:
Oct. 27, 2010
James B. Nolan, Chandler, AZ (US);
Kumen Blake, Gilbert, AZ (US);
James B. Nolan, Chandler, AZ (US);
Kumen Blake, Gilbert, AZ (US);
Microchip Technology Incorporated, Chandler, AZ (US);
Abstract
Calibration of gain and/or offset of an instrumentation amplifier (INA) is accomplished by coupling an appropriate number of current sources, and/or current sinks, respectively, to first and/or second transconductance stage(s) of the INA. Gain and/or offset calibration of the INA may occur when requested by a user and/or the occurrence of an event(s). A voltage reference may be used in combination with a successive approximation register analog-to-digital converter in determining which ones of the current sources and sinks are coupled to the first and/or second transconductance stage(s) of the INA for gain and/or offset calibration thereof. After the gain and/or offset calibration of the INA is completed, the selection of the constant current sources and sinks used therefore may be stored in volatile or nonvolatile memory. Parity checking of the memory may be incorporated and if a parity error is detected, an auto-calibration of the INA may be initiated.