The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2011
Filed:
Mar. 25, 2009
Applicants:
Weitian Chen, Menlo Park, CA (US);
Peng HU, Quincy, MA (US);
Craig H. Meyer, Charlottesville, VA (US);
Inventors:
Weitian Chen, Menlo Park, CA (US);
Peng Hu, Quincy, MA (US);
Craig H. Meyer, Charlottesville, VA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
In a rapid auto-calibrated partially parallel reconstruction method, the unaliasing process is approached by convolution. The image combination is performed on a low-resolution image matrix before unaliasing, and the unaliasing process is effectively performed once for a single synthetic target coil instead of for each individual coil.
Chen, Weitian. (2011). Rapid auto-calibrated parallel reconstruction using synthetic target coil (U.S. Patent No. 8026720). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8026720
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile