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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8026499 B1

PDFFull Text
Date of Patent:
Sep. 27, 2011

Filed:

Apr. 11, 2011

Method of calibrating a wavelength-modulation spectroscopy apparatus using a first, second and third gas to determine temperature and pressure values to calculate concentrations of analytes in a gas

Applicants:

Xiaoyong Liu, Malden, MA (US);

Yufeng Huang, North Chelmsford, MA (US);

John Mckinley Poole, Maynard, MA (US);

Gene Smith Berkowitz, Sudbury, MA (US);

Anthony Kowal, Berlin, MA (US);

Shawn D. Wehe, Niskayuna, NY (US);

Hejie LI, Schenectady, NY (US);

Inventors:

Xiaoyong Liu, Malden, MA (US);

Yufeng Huang, North Chelmsford, MA (US);

John McKinley Poole, Maynard, MA (US);

Gene Smith Berkowitz, Sudbury, MA (US);

Anthony Kowal, Berlin, MA (US);

Shawn D. Wehe, Niskayuna, NY (US);

Hejie Li, Schenectady, NY (US);

Assignee:

GE Infrastructure Sensing, Inc., Billerica, MA (US);

Attorneys:

Global Patent Operation

Mark A. Conklin

Primary Examiner:

Que T Le

Assistant Examiner:

Jennifer Bennett

Int. Cl.
CPC ...
G01V 8/00 (2006.01); G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

Several methods of calibrating a wavelength-modulation spectroscopy apparatus configured to measure a concentration of an analyte in a sample gas are disclosed. Each of the methods allows for calibration and recalibration using a relatively safe gas regardless of whether the sample gas for which the concentration of the analyte can be determined is a hazardous gas. In one embodiment of the invention, calibration that is sample-gas specific is accomplished by determining a first slope coefficient and calibration function for the sample gas, after which a scaling factor can be determined based on the first slope coefficient and a second slope coefficient for the same or a different sample gas and used in a subsequent calibration (or recalibration) to scale the calibration function. In other embodiments of the invention, calibration that is not sample-gas specific is accomplished to allow for the determination of the analyte concentration in variable gas compositions and constant gas compositions.

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Quick Actions:

Liu, Xiaoyong. (2011). Method of calibrating a wavelength-modulation spectroscopy apparatus using a first, second and third gas to determine temperature and pressure values to calculate concentrations of analytes in a gas (U.S. Patent No. 8026499). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8026499

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