The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2011
Filed:
Mar. 16, 2010
Michael T. Mueller, Pflugerville, TX (US);
Albert P. Pisano, Danville, CA (US);
Robert Azevedo, Albany, CA (US);
David C. Walther, Oakland, CA (US);
David R. Myers, Albany, CA (US);
Matthew Wasilik, Moraga, CA (US);
Michael T. Mueller, Pflugerville, TX (US);
Albert P. Pisano, Danville, CA (US);
Robert Azevedo, Albany, CA (US);
David C. Walther, Oakland, CA (US);
David R. Myers, Albany, CA (US);
Matthew Wasilik, Moraga, CA (US);
The Regents of the University of California, Oakland, CA (US);
Abstract
An infrared sensor with at least one cantilever beam functionalized with chitin, chitosan or their derivatives that can be tailored to be sensitive to certain IR bands for detection and does not require cooling is described. The functional layers expand differently than the structural layer of the cantilever beam causing the beam to bend in response to exposure to infrared radiation. The sensor can be adapted to optical, piezoresistive, capacitive and piezoelectric methods of detect beam deflection. Sensitivity can be increased with a reflective layer to increase the absorption of infrared radiation by the functional layer.