The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2011

Filed:

Sep. 27, 2007
Applicants:

Stuart R. Grant, Warsaw, IN (US);

Anthony J. Metzinger, Winona Lake, IN (US);

David A. Hawkes, Winona Lake, IN (US);

Andrew H. Berthusen, Leesburg, IN (US);

Inventors:

Stuart R. Grant, Warsaw, IN (US);

Anthony J. Metzinger, Winona Lake, IN (US);

David A. Hawkes, Winona Lake, IN (US);

Andrew H. Berthusen, Leesburg, IN (US);

Assignee:

DePuy Products, Inc., Warsaw, IN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 17/60 (2006.01); A61B 17/58 (2006.01);
U.S. Cl.
CPC ...
Abstract

A measurement apparatus has a body that includes a reference surface that defines a reference line. The body further includes a first elongate window defining a first measurement line and a first measurement indicia positioned in association with the first elongate window. The first measurement line and the reference line define a first angle having a first magnitude. The first measurement indicia corresponds to the first magnitude.


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