The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2011

Filed:

Jun. 06, 2008
Applicant:

Mikhail Belenkii, San Diego, CA (US);

Inventor:

Mikhail Belenkii, San Diego, CA (US);

Assignee:

Trex Enterprises Corp, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F21S 8/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An improved beaconless adaptive optics system and process. A target is illuminated with a high energy laser beam of a directed energy laser. Wave front measurements are made of high energy laser beam reflections from the target. These wave front measurements are analyzed by a high speed processor to determine both high frequency phase components and low frequency phase components in the wave front data. (Applicants' experiments have shown that there is a direct correlation between beam spot size on the target and the phase variance of the reflected laser beam. The correlation is: the greater the phase variance the smaller the beam spot size.) Applicants have developed a technique for providing special control algorithms that provide very high speed control of the elements of a deformable mirror using this phase variance as a feedback parameter. Applicants have also developed algorithms to correct a limited number of Zernike modes associated with the wave front control.


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