The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2011

Filed:

Jun. 30, 2006
Applicants:

Hideki Yabushita, Chiba, JP;

Tatsuyuki Nagai, Osaka, JP;

Shigeyuki Matsubara, Osaka, JP;

Norio Nemoto, Ibaraki, JP;

Hiroshi Miyamoto, Chiba, JP;

Inventors:

Hideki Yabushita, Chiba, JP;

Tatsuyuki Nagai, Osaka, JP;

Shigeyuki Matsubara, Osaka, JP;

Norio Nemoto, Ibaraki, JP;

Hiroshi Miyamoto, Chiba, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/04 (2006.01); G01N 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An ultrasonic wave is sent from a transmission element to a test element to produce a plate wave in the test element, and the plate wave propagating through the test element is received by a reception element to thereby test the test element on the propagation route of the plate wave. The other probe that is the other reception element or transmission element is disposed between the transmission element and the reception element. A probe holding mechanism that has support legs contacting the surface of the test element and keeps constant an angle of the other probe with respect to the surface of the test element is allowed to support the other probe. And, the other probe is allowed to cross over in non-contact the propagation route of the plate wave extending from the transmission element to the reception element by means of support legs.


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