The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2011

Filed:

Mar. 30, 2007
Applicants:

Marion Behnen, Austin, TX (US);

Richard L. Cole, Los Gatos, CA (US);

Qi Jin, San Jose, CA (US);

Timo Pfahl, Zurich, CH;

Holger Pirk, Berlin, DE;

Inventors:

Marion Behnen, Austin, TX (US);

Richard L. Cole, Los Gatos, CA (US);

Qi Jin, San Jose, CA (US);

Timo Pfahl, Zurich, CH;

Holger Pirk, Berlin, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/048 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method, computer program product, and system for analyzing data using a data warehouse application are provided. The method, computer program product, and system provide for displaying a facet in a user interface of the data warehouse application, the facet classifying a plurality of documents, and displaying a facet attribute of the facet in the user interface of the data warehouse application, the facet attribute corresponding to a characteristic associated with each of the plurality of documents classified by the facet.


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