The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2011

Filed:

Jun. 26, 2008
Applicants:

Pawan R. Chowdhary, Montrose, NY (US);

Hui Lei, Scarsdale, NY (US);

George Andrei Mihaila, Yorktown Heights, NY (US);

Themis Palpanas, Dobbs Ferry, NY (US);

Inventors:

Pawan R. Chowdhary, Montrose, NY (US);

Hui Lei, Scarsdale, NY (US);

George Andrei Mihaila, Yorktown Heights, NY (US);

Themis Palpanas, Dobbs Ferry, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method, information processing system, and computer readable medium for modifying at least one data warehouse schema based on detected changes in an associated observation model are disclosed. The method includes determining if at least one new observation model has been created. The method also includes determining if at least one existing observation model is associated with the new observation model. In response to the existing observation model being associated with the new observation model, at least one changed attribute is identified by comparing the new observation model and the existing observation model. A set of files associated with the existing observation model is updated to reflect the changed attribute between the new observation model and the existing observation model.


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