The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2011
Filed:
Jan. 08, 2009
Applicants:
Grace Kwan-on AU, Rancho Palos Verdes, CA (US);
Rama Krishna Korlapati, El Segundo, CA (US);
Haiyan Chen, Yorktown Heights, NY (US);
Inventors:
Grace Kwan-On Au, Rancho Palos Verdes, CA (US);
Rama Krishna Korlapati, El Segundo, CA (US);
Haiyan Chen, Yorktown Heights, NY (US);
Assignee:
Teradata US, Inc., Dayton, OH (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract
Techniques for independent column detection in selectivity estimations are provided. Values for database statistics are sampled and two independent tests are performed against the values for a first column and a second column. When each test determines that the first and second columns are independent, the first and second columns are said to be independent columns for selectivity estimation.