The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2011

Filed:

Mar. 14, 2007
Applicants:

Takanao Uchida, Saitama, JP;

Hideharu Koga, Saitama, JP;

Inventors:

Takanao Uchida, Saitama, JP;

Hideharu Koga, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A management system of CAD data is provided, which stores sets of the CAD data, and a set of mesh conditions under which a CAE model is created from each of the sets of the CAD data and a set of analysis conditions under which CAE analysis on the created CAE model is performed associated with each set of the CAD data. Moreover, the management system of CAD data, to perform the CAE analysis on one of the sets of the CAD data, reads from the storage unit the set of the CAD data, and the set of the mesh conditions and the set of the analysis conditions associated with the set of the CAD data, creates the CAE model from the set of the CAD data under the read set of the mesh conditions, and perform the CAE analysis on the created CAE model under the read set of the analysis conditions.


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