The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2011

Filed:

Dec. 20, 2007
Applicants:

Mathieu Gagnon, Verdun, CA;

Jurgen Hissen, Port Moody, CA;

Inventors:

Mathieu Gagnon, Verdun, CA;

Jurgen Hissen, Port Moody, CA;

Assignee:

PMC-Sierra US, Inc., Sunnyvale, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for analyzing a signal waveform that comprises digitally sampling a signal at a periodic sampling interval, and accumulating a count of samples of the signal at a given logic level relative to a threshold value over a given period. The threshold value is stepped through a series of values while the accumulating of samples is repeated at a series of different clock offsets. The accumulated counts permit a statistical distribution of the signal waveform to be determined. A signal density can also be calculated by determining the difference between the count of adjacent samples at successive threshold values.


Find Patent Forward Citations

Gagnon, Mathieu. (2011). Method and system for analyzing signal waveforms (U.S. Patent No. 8024142). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8024142

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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