The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2011

Filed:

Jan. 30, 2009
Applicants:

Kai Hsu, Sugar Land, TX (US);

Peter S. Hegeman, Stafford, TX (US);

Chengli Dong, Sugar Land, TX (US);

Ricardo Vasques, Sugar Land, TX (US);

Inventors:

Kai Hsu, Sugar Land, TX (US);

Peter S. Hegeman, Stafford, TX (US);

Chengli Dong, Sugar Land, TX (US);

Ricardo Vasques, Sugar Land, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 8/00 (2006.01); E21B 49/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

Apparatus and methods to monitor contamination levels in a formation fluid are disclosed. An example method involves obtaining first property data indicative of a first fluid property of a formation fluid and second property data indicative of a second fluid property of the formation fluid. A correlation between the first and second property data is generated and third data is fitted to the correlation. A fitting parameter is determined based on the third data indicative of an amount of change of the first property data relative to an amount of change of the second property data.


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