The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8024025 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 20, 2011

Filed:

May. 05, 2008
Applicants:

Richard Philip Mallozzi, Middleton, MA (US);

Charles Lucian Dumoulin, Ballston Lake, NY (US);

Inventors:

Richard Philip Mallozzi, Middleton, MA (US);

Charles Lucian Dumoulin, Ballston Lake, NY (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/05 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and method for correcting magnetic resonance temperature measurements is disclosed. In one aspect, the method identifies monitoring regions of interest outside a therapeutic region of interest. Next, a pulse sequence sensitive to changes in Tand proton density is used to measure the temperature changes in these regions. Next, the PRFS is measured in these same regions. The PRFS in these regions will be caused both by the desired shift from temperature change, and the undesired shift from background magnetic field changes. Using the measured temperature changes from the T-method, the component of the PRFS due to actual temperature changes is subtracted from the PRFS method, leaving only the component caused by the unwanted magnetic field changes. This analysis is performed separately for each region. At the end of this step, one has measured the change in background magnetic field within each region.


Find Patent Forward Citations

Mallozzi, Richard. (2011). T1-corrected proton resonance frequency shift thermometry (U.S. Patent No. 8024025). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8024025

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