The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2011
Filed:
Oct. 30, 2008
Paul J. Degruchy, Hilton, NY (US);
Steven Robert Moore, Pittsford, NY (US);
Ruddy Castillo, Briarwood, NY (US);
Peter J. Knausdorf, Henrietta, NY (US);
Paul J. DeGruchy, Hilton, NY (US);
Steven Robert Moore, Pittsford, NY (US);
Ruddy Castillo, Briarwood, NY (US);
Peter J. Knausdorf, Henrietta, NY (US);
Xerox Corporation, Norwalk, CT (US);
Abstract
A method and apparatus for media thickness measurement in an image production device is disclosed. The method may include receiving images of a media stack from an imaging device, measuring one or more sheet-to-sheet interfaces in the media stack from the received images, determining the media thickness based on the sheet-to-sheet interface measurements, and adjusting at least one image production device parameter based on the determined media thickness.